主页解决方案分立器件与集成电路

线性拾取放置测试与视觉检测

Our Linear Pick & Place Test & Vision Handlers integrate direct docking with a streamlined linear mechanism, delivering precision and efficiency across development, low-volume, and high-volume production.

Mason

线性拾取放置设备

一个高性能拾取放置设备，专为大批量多测试站的集成电路和图像传感器测试而设计，支持单、双、四和八个测试站。

JEDEC 托盘
QFP、BGA、QFN、MLF、TSSOP、SOIC、SIP、ODFN、OLGA
电气功能测试、CMOS 图像传感器测试、常温至高温测试
多达 16 个测试站
AERO-10

Device Characterization System

It is a space efficient and versatile test system for power semiconductors, MEMS and optical devices - from development to low-volume production.

JEDEC Tray, Automated Tray Stacker, Waffle Pack, Wafer Ring, Plastic/Metal Tube, Vibrator Bowl Feeder
JEDEC Tray, Automated Tray Stacker, Waffle Pack, Wafer Ring, Plastic/Metal Tube, Tape & Reel
SOP, SOJ, SON, QFP, QFJ, QFN, LGA, BGA, WLCSP, bare die
(Can be configured to all packages within size limitations)
ICs, Optical devices, Sensors, Power Devices
(Standard and customized test stations available)
Stimulus Options
  • Environmental chambers for gas, humidity and pressure sensor test
  • Dual-axis motion setup for inertial sensor test
  • Magnetic field stimulus for magnetometer and hall effect
  • Ambient light sensors test units (dark, angle, sensitivity, linearity, gain, spectral response)
High Power Test
  • KGD and discrete Final Test
Standard: Single Site (Multi-site per request)
  • Direct Dock from bottom
  • Direct Dock with cable connection
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