News Release
MES – The Digital Transformation to accelerate your manufacturing processes.
Pentamaster unveils its 2nd generation WLBI-22 which paves the way for cost effective and advance burn-in test solution for SiC wafer.
Automated Reel Packer – Pentamaster’s packaging solution to the semiconductor industry
High Power/Voltage Wafer-Level Burn-in Test Solution for Silicon Carbide (SiC)
Trooper-V: Wafer AOI Solution which eliminates reliance on human handling while optimizing productivity and yield.
Latest µLED Display Module Final Test Solution which empowers display manufacturers to maximize efficiency and yield.
Pentamaster launches its first ever Tri-Temperature Test technology for Optics Sensors.
Pentamaster unveils Burn-in Test Solutions for Power Devices with User Definable Burn-in Profile
Introducing Pentamaster’s One Stop Test & Active Alignment Assembling Solutions for 3D Smart Sensors
High Precision Micron Laser Marking Solution for Wafer-Level Packages.
